Section 5: Instrument specifications and documentation
S540 Power Semiconductor Test System Administrative Guide
5-4
S540-924-01 Rev. D / January 2019
Features include:
Source ± DC voltage from 5 mV to 3030 V
Source ± DC current from 30 fA to 120.12 mA
Measure ± DC voltage from 1 mV to 3030 V
Measure ± DC current from 20 fA to 120.12 mA
Optional instrumentation
Keithley Test Environment (KTE) version 5.7.0 supports several optional instruments:
DMM7510 7½ Digit Graphical Sampling Multimeter
4200A-SCS Parameter Analyzer
4210-CVU Capacitance-Voltage Unit Card
4220-PGU High-Voltage Pulse Generator Unit Card
RSA306B USB Spectrum Analyzer
The cards and columns of each instrument connection shown in the following diagrams may differ
from your actual system. The flexibility of the S540 configuration allows for various numbers and
combinations of instruments. Attempting to show examples of every possible scenario would be
prohibitive.
For high-voltage systems with two 707B switch matrices, the high-voltage connections for the
second matrix (not shown) are identical to the ones in the diagrams in this manual.
Typical matrix connections
The following figures show typical matrix connections for the S540 3000-V high-voltage system and
the 3000 V high-voltage, low-current system.
The cards and columns of each instrument connection shown in the following diagrams may differ
from your actual system. The flexibility of the S540 configuration allows for various numbers and
combinations of instruments. Attempting to show examples of every possible scenario would be
prohibitive.
