In this section:
Subroutine descriptions ............................................................ 3-1
Subroutine descriptions
beta1
This subroutine calculates the DC beta (
) of a test device at constant emitter current (I
E
) and collector-base bias
(V
CB
). The device is in the common-base configuration.
Usage
double beta1(int
e
, int
b
, int
c
, int
sub
, double
ie
, double
vcb
, char
type
);
e
Input
The emitter pin of the device
b
Input
The base pin of the device
c
Input
The collector pin of the device
sub
Input
The substrate pin of the device
ie
Input
The forced emitter current, in amperes
vcb
Input
The forced
c
to
b
bias, in volts
type
Input
Type of transistor:
"N"
or
"P"
Returns
Output
The calculated beta of the device:
-1.0
= TYPE not "N" or "P"
-2.0
= SMU2 overload
-3.0
= Divide by 0, or
< 0.01
-4.0
=
> 10 K or I
B
wrong sign
-5.0
= Emitter voltage limit reached; developed emitter voltage is
within 98 % of the 3 V voltage limit
Details
If a positive substrate pin is specified, the substrate is grounded. If a positive substrate pin is not
specified, the substrate is left floating.
A delay is incorporated into the
beta1
subroutine; this delay is the calculated time required for stable
forcing of emitter current with a 3 V voltage limit.
Section 3
Test subroutine library reference
