
S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual
Section 3: LPTLib command reference
S530-900-01 Rev. E / September 2017
3-5
Combination commands
Command
Description
(on page 3-8)
Sweep with a user-defined force array (i, v).
(on page 3-13)
Block measurement; take a series of readings as quickly as
possible (i, v).
(on page 3-15)
Sweep and shutdown source if device meets trigger condition
(i, v).
(on page 3-17)
Clear any sweep measurements.
Clear any set triggers.
(on page 3-47)
Force a pulse and measure voltage and current.
(on page 3-63)
Return forced array after sweep.
(on page 3-64)
Average each point of associated sweep (i, v).
(on page 3-71)
Search for a specific current or voltage.
(on page 3-82)
Integrate each point of associated sweep (i, v).
(on page 3-84)
Measure each point of associated sweep (i, t, v).
Sweep a specified range of current or voltage.
(on page 3-91)
Trigger if a measurement is greater than a specific value
(i, t, v).
Trigger if a measurement is less than a specific value (i, t, v).
Timing commands
Command
Description
(on page 3-8)
Specify an array of delay points to use in a sweep.
(on page 3-24)
Set a user-defined delay in a test sequence (in milliseconds).
(on page 3-28)
Disable the timer.
(on page 3-28)
Initialize and start the timer.
(on page 3-32)
Read the timer (immediate measure time).
(on page 3-62)
Set a user-defined delay (in seconds).
GPIB commands
Command
Description
(on page 3-36)
Clear instrument on
devclr
command.
Clear instrument on
delay
command.
(on page 3-38)
Read device-dependent string.
(on page 3-39)
Send device-dependent command.
(on page 3-40)
Serial poll an instrument.
(on page 3-41)
Synchronous serial poll an instrument.