S530/S540 KTE Linear Parametric Test Library (LPTLib) User's Manual
Section 3: LPTLib command reference
S530-900-01 Rev. E / September 2017
3-47
mpulse
This command uses a source-measure unit (SMU) to force a voltage pulse and measure both the voltage and
current for exact device loading.
Usage
int mpulse(int
instr_id
, double
pulse_amplitude
, double
pulse_duration
, double *
vmeas
,
double *
imeas
);
instr_id
The instrument identification code of the instrument under control
pulse_amplitude
The pulse height in volts
pulse_duration
The pulse width in seconds; the measurements are made at the end of the pulse
before the
mpulse
command is shut down
vmeas
The variable used to receive the voltage on the output of the SMU at the time the
pulse terminates; this reading is buffered internally
imeas
The variable used to receive the current drawn from the SMU; this measurement is
made simultaneously with the voltage, so the combined values are an exact
representation of the device load at pulse termination
Details
Voltage and current are measured just before the pulse terminates. Pulse mode is used because the
device under test will be destroyed if the voltage is applied for a long period of time, such as with
GaAs type devices or high-power bipolar.
Example
.
.
mpulse(SMU1, vds, 1.0E-3, vdsat, idsat)
This example measures the drain current of a metal-oxide semiconductor field-effect transistor (MOSFET)
when drain-source voltage (V
DS
) equals gate-source voltage (V
GS
). A voltage pulse, V
DS
, is applied to the
drain. The pulse duration is 1 ms. Voltage across the MOS transistor, V
DSAT
, and drain current, I
DSAT
, are
measured.
Also see
None