Interchangeable Parts
The eyepiece can be removed
by grasping with thumb and
forefinger and sliding in or out
of the eyepiece sleeve. Care
should be taken to avoid dirt
or moisture entering the tube
when removing eyepiece.
A 10X reticle eyepiece enables
visual width measurements.
Width observations are valid
only at 100X magnification
(10X Reticle Eyepiece with
10X Objective Lens).
To change the objective lens,
turn the focus adjustment
clockwise until the threads of
the objective lens are visible
at the base of the Micrometer.
Holding the Micrometer body
firmly, grasp objective lens and
turn counter-clockwise until
threads disengage.
100X and 200X magnification
is recommended for inspecting
scratch depth, scribe lines,
blind holes, corrosion pits,
spurs and other very small
protrusions or indentations.
40X and 80X magnification
is
recommended for inspecting
transparent materials for
overall thickness and the depth
of fractures and imbedded
bubbles or “seeds”.
Both the eyepiece and the
objective lens can be
removed and replaced for
levels of magnification from
40X to 200X. Bases can be
swapped to accommodate
different surfaces.
To remove a base, firmly hold
the Micrometer barrel and turn
the base counter-clockwise
until the threads disengage.
To replace, select desired base
and thread onto the Micrometer
body in a clockwise direction.
DO NOT OVER-TIGHTEN.
The
tripod
base
is
recommended for flat surfaces.
The
quadpod
base
is
recommended for simple
curved surfaces.
The
transparent V-block base
is recommended for small
diameters, outside angles and
flat surfaces near a recess.
Four additional bases are
available, please call for price
and availability.
▪
An
offset base
for
measurements along edges.
▪
A
delrin-tipped tripod base
for delicate finishes.
▪
A
large tripod base
for parts
inspection.
▪
A
wedge bipod base
for
corners and inside angles.