Datasheet
77
Signal Description
6.9
TAP Signals
Table 6-30.TAP Signals
Signal Name
Description
Direction/Buffer
Type
TCK
TCK (Test Clock):
Provides the clock input
for the processor Test Bus (also known as
the Test Access Port).
I
CMOS
TDI
TDI (Test Data In):
Transfers serial test
data into the processor. TDI provides the
serial input needed for JTAG specification
support.
I
CMOS
TDO
Test Data Output
O
CMOS
TDI_M
Test Data In for the GPU/Memory core:
Tie TDI_M and TDO_M together on the
motherboard
I
CMOS
TDO_M
Test Data Output from the processor
core:
Tie TDO_M and TDI_M together on the
motherboard.
O
CMOS
TMS
TMS (Test Mode Select):
A JTAG
specification support signal used by debug
tools.
I
CMOS
TRST#
TRST# (Test Reset) Boundary-Scan test
reset pin
I
CMOS
TAPPWRGOOD
Power good for ITP
O
Asynchronous CMOS
