Technical Reference Manual
002-29852 Rev. *B
18.13.2 LIN_TEST_CTL
Description:
Test control
Address:
0x40500004
Offset:
0x4
Retention:
Retained
IsDeepSleep:
No
Comment:
This register support test functionality.
Default:
0x0
Bit-field Table
Bits
7
6
5
4
3
2
1
0
Name
None [7:5]
CH_IDX [4:0]
Bits
15
14
13
12
11
10
9
8
Name
None [15:8]
Bits
23
22
21
20
19
18
17
16
Name
None [23:17]
MODE
[16:16]
Bits
31
30
29
28
27
26
25
24
Name
ENABLED
[31:31]
None [30:24]
Bit-fields
Bits Name
SW
HW
Default or
Enum
Description
0:4
CH_IDX
RW
R
0
Specifies the channel index of the channel to which
test applies. The channel IO signals of channel indices
CH_IDX and CH_NR-1 are connected as specified by
MODE. CH_IDX should be in the range [0, CH_NR-2],
as channel index CH_NR-1 is always involved in test
and cannot be connected to itself. The test mode
allows BOTH of the two connected channels to be
tested.
Note: this testing functionality simplifies SW
development, but may also be used in the field to
verify correct channel functionality.
1043
2022-04-18
TRAVEO™ T2G Automotive MCU: TVII-B-E-4M body controller entry registers