Document Number: 001-98285 Rev. *R
Page 43 of 108
S29GL01GS/S29GL512S
S29GL256S/S29GL128S
5.7
Embedded Algorithm Performance Table
Notes:
1. Not 100% tested.
2. Typical program and erase times assume the following conditions: 25 °C, 3.0 V V
CC
, 10,000 cycle, and a random data pattern.
3. Under worst case conditions of 90 °C, V
CC
= 2.70 V, 100,000 cycles, and a random data pattern.
4. Effective write buffer specification is based upon a 512-byte write buffer operation.
5. In the pre-programming step of the Embedded Erase algorithm, all words are programmed to 0000h before Sector and Chip erasure.
6. System-level overhead is the time required to execute the bus-cycle sequence for the program command. See
for further information on
command definitions.
Table 5.4
Embedded Algorithm Characteristics (-40°C to +85°C)
Parameter
Typ
Unit
Comments
Sector Erase Time 128 kbyte
275
1100
ms
Includes pre-programming
prior to erasure
Single Word Programming Time
125
400
µs
Buffer Programming Time
2-byte
125
750
µs
160
750
175
750
128-byte
198
750
256-byte
239
750
512-byte
340
750
Effective Write Buffer Program
Operation per Word
512-byte
1.33
–
µs
Sector Programming Time 128 kB (full Buffer
Programming)
108
192
ms
Erase Suspend/Erase Resume (t
ESL
)
–
40
µs
Program Suspend/Program Resume (t
PSL
)
–
40
µs
Erase Resume to next Erase Suspend (t
ERS
)
100
–
µs
Minimum of 60 ns but
typical
periods are needed for Erase
to progress to completion.
Program Resume to next Program Suspend (t
PRS
)
100
–
µs
Minimum of 60 ns but
typical
periods are needed for
Program to progress to
completion.
Blank Check
6.2
8.5
ms
NOP (Number of Program-operations, per Line)
–
256