Hitachi OE700 Series, Operating Manual

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Hitachi High-Tech Analytical Science
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63
12 Annex
12.2 Glossary
AES
Short for Atomic Emission Spectrometry
OES
Short for Optical Emission Spectrometry
arc mode
here: Using an arc probe or a combined probe with the arc adapter. The sparking takes
place in an air atmosphere without argon. Thus, the measurement is less precise but
can be carried out faster and is less complicated.
CMOS sensors
are light-sensitive semiconductor chips used to measure the intensity of a radiation
source. In a spectrometer, the source is the plasma generated during sparking.
CRM
Short for Certified Reference Material:
designation for samples whose precise composition is known. Used for spectrometer
recalibration.
spark mode
In spark mode, the sparking takes place in argon atmospheres in the spark stand for
stationary instruments and in the spark adapter of the combined probe or in the head of
the UVPro probe and the spark probe for mobile instruments.
ICP
Short for Inductively Coupled Plasma
PMI
Short for Positive Material Identification
plasma
Plasma is a material state in which atoms or molecules are split into charged fragments
(ions and electrons) at very high temperatures. Excited atoms and ions emit light of
discrete wavelengths the intensity of which is measured in the spectrometer.
recalibration
Periodic remeasuring of a measuring/test device (here spectrometer and recalibration
sample) to monitor and adjust its accuracy.
standard deviation
The standard deviation is a measure for the deviation of measured values around their
average value. A distinction is made between relative standard deviation (RSD) and
absolute standard deviation (SD).
white burn spot
Poor burn spot with very low luminous efficacy. It results from contamination on the
sparked surface.
XRF
Short for X-ray fluorescence