Hioki ST5680, Instruction Manual, Page: 38 / 253

38
Setting the Test Conditions
Test conditions
Test conditions that can be set are different for DCW and IR.
Test correspondence table for test conditions
Test conditions Description DCW IR Reference
Test voltage Voltage value to be applied to the test target
 
p. 39
Limit voltage
Upper-limit value for the voltage to be applied to
the test target
 
p. 40
Start voltage
Voltage value after 0.1 seconds from the start of
test

– p. 42
Judgment upper-limit
value
Upper-limit judgment reference value of the current
or resistance value
 
p. 43
Judgment lower-limit
value
Lower-limit judgment reference value of the current
or resistance value
 
p. 44
Automatic range
The function that switch the range to another
according to a measured value
 
p. 46
Test time
Time period from the elapsed voltage rise time to
the end of test
 
p. 48
Voltage rise time
Time period from the start of test until the test
voltage is reached
or time period from the start voltage until the test
voltage is reached
 
p. 50
Voltage drop time Voltage drop time after a pass judgment is made
 
p. 51
Judgment wait time
Time period from the start of test until a current
value upper-limit judgment is started
or time period from the start of test until a
resistance value lower-limit judgment is started
 
p. 52
Insulation resistance
test end mode
Sets the conditions to end an insulation resistance
test.
–

p. 108
Arc detection
Detects the discharge current of arc according to
fluctuation of test voltage.

– p. 54
Contact check
Checks whether the test lead is properly connected
to the test target.
 
p. 105
Offset cancel
Measures the current flowing a stray capacitance,
such as a test lead and measurement jig, and
cancels the current according to the measurement
result.
 
p. 56
HIOKI ST5680A961-00