Hioki RM3545, Instruction Manual, Page: 302 / 364

14.1 Troubleshooting
294
•
When low-power resistance measurement is on, OVC will be fixed to on and contact
improvement will be fixed to off. During SLOW2 operation, two-iteration averaging is used
even if the averaging function is off.
•
When the multiplex scan function is set to auto or step, the trigger source is automatically
set to EXT, and the communications function’s memory function will not be available for
use.
•
When using the multiplexer in 2-wire mode, neither the contact check function nor ranges
of less than 1000 m
Ω
will be available for use.
6-7 Zero-adjustment
values are not
being applied.
Check whether zero-adjustment has
been performed for each channel on
the Multiplexer Basic Measurement
screen.
→
Zero-adjustment is performed
separately for the front terminals
and for each channel, so you will
need to perform it for each chan-
nel (scanning zero-adjustment
can also be performed).
p.163
6-8 Zero-adjustment
cannot be per-
formed.
Measured values before zero-adjust-
ment exceed -1% to 50% of each
range full-scale, or a measurement
fault has occurred. The wiring resistance is too high.
→
Zero-adjustment cannot be per-
formed when the wiring resis-
tance is too high. Modify your
setup so that the wiring resis-
tance is less than 50% of the
measurement target.
p.A7
The connected device is set to an
external device. Zero-adjustment cannot be per-
formed for channels whose con-
nected device is an external
device.
→
Set the connected device to the
RM3545.
6-9 The self-test gen-
erates a FAIL
result.
The relays are worn.
→
Have the Z3003 repaired.
p.301
6-10 Switching is too
slow.
The relay hot switching prevention
function is being triggered because
back EMF is remaining when mea-
suring a transformer.
→
Use a high-resistance range or
lower the measurement cur-
rent, for example by using the
low current switching setting.
p.142
No Issue Items to check Possible causes
→
Solutions See
Function limitations (
√
: Compatible,
−
: Incompatible)
COMP TC
Δ
T BIN MUX STAT
AUTO RANGE,
RANGE change
COMP
√
− −
√ √
−
TC
√ − √ √ √ √
Δ
T
− − − √ − √
BIN
− √ − − √ −
MUX
√ √ √
− −
√
STAT
√ √ − √ − √
AUTO RANGE,
RANGE change
−
√ √
−
√ √