Hioki MR8827, Instruction Manual

Page: 57 / 436

52
Measurement Configuration
3.3 Measurement Configuration
Set measurement conditions as follows.
You can immediately verify the effect of settings on the waveform by calling up the Waveform screen
and using the Settings window to make basic settings. Basic settings can also be made by calling up the
Status screen and selecting the
[Status]
sheet.
Open the Settings Window
“Recording
Length (Number
of divisions)”
(p. 57)
“Timebase
setting
(Sampling rate)”
(p. 54)
“Settings
window”
(p. 52)
Press this key.
3.3.1 Measurement Function
Select the function according to the target and type of measurement.
Procedure
Press the
DISP
key to open the Waveform screen.
Move the cursor to the function item (the upper most column of
the Settings window).
MEMORY (
Default setting)/
RECORDER/ X-Y RECORDER/ FFT
Measure an instantaneous waveform or a transient phenomenon.
Trigger and calculation functions can be used.
Record the variation and monitoring data of a slow phenomenon.
Data can be printed in real time.
An endless X-Y waveform can be displayed.
Pen up/down operation as in an X-Y pen recorder is possible.
Refer to “4 X-Y Recorder Function” (p. 71).
Analyze the frequency.
Perform various types of spectrum and octave analysis.
Refer to “13 FFT Function” (p. 243).