MSC8144E Reference Manual, Rev. 3
3-58
Freescale
Semiconductor
External Signals
3.15 Other Interrupt Signals
Table 3-17 summarizes the other interrupt signal lines.
3.16 OCE Event and JTAG Test Access Port Signals
The MSC8144E uses two sets of debugging signals for the two types of internal debugging
modules: OCE and the JTAG TAP controller. Each internal SC3400 core has an OCE module,
but they are all accessed externally by the same two signals
EE0
and
EE1
. The MSC8144E
supports the standard set of test access port (TAP) signals defined by IEEE® Std. 1149.1™ Test
Access Port and Boundary-Scan Architecture specification and described in Table 3-18.
Table 3-17. Other Interrupt Signals
Signal Name
Type
Description
INT_OUT
Output
Interrupt Output
An open-drain pin driven from the MSC8144E internal interrupt controller. Assertion of this
output indicates that an unmasked interrupt is pending in the MSC8144E internal interrupt
controller.
NMI
Input
Non-Maskable Interrupt
External device may assert this line to generate a non-maskable interrupt to the MSC8144E
device.
NMI_OUT
Output
Non-Maskable Interrupt Output
An open-drain pin driven from the MSC8144E internal interrupt controller. Assertion of this
output indicates that a non-maskable interrupt is pending in the MSC8144E internal interrupt
controller, waiting to be handled by an external host.
Table 3-18. JTAG TAP Signals
Signal Name
Type
Signal Description
EE0
Input
OCE Event Bit 0
Used for putting the internal SC3400 cores into Debug mode. Pulling the signal high asserts
the signal and requests that the cores enter Debug mode.
EE1
Output
OCE Event Bit 1
Indicates that at least one on-chip SC3400 core is in Debug mode. A high output indicates
that at least one SC3400 core is in Debug mode.
TCK
Input
Test Clock
A test clock signal for synchronizing JTAG test logic.
TDI
Input
Test Data Input
A test data serial signal for test instructions and data. TDI is sampled on the rising edge of
TCK and has an internal pull-up resistor.
TDO
Output
Test Data Output
A test data serial signal for test instructions and data. TDO can be tri-stated. The signal is
actively driven in the shift-IR and shift-DR controller states and changes on the falling edge of
TCK.
TMS
Input
Test Mode Select
Sequences the test controller’s state machine, is sampled on the rising edge of TCK, and has
an internal pull-up resistor.
TRST
Input
Test Reset
Asynchronous JTAG reset input. Initializes the TAP logic. This signal should always be
connected to PORESET.
Summary of Contents for MSC8144E
Page 1: ...MSC8144E Reference Manual Quad Core Media Signal Processor MSC8144ERM Rev 3 July 2009 ...
Page 48: ...MSC8144E Reference Manual Rev 3 xlviii Freescale Semiconductor ...
Page 86: ...MSC8144E Reference Manual Rev 3 1 38 Freescale Semiconductor Overview ...
Page 168: ...MSC8144E Reference Manual Rev 3 3 60 Freescale Semiconductor External Signals ...
Page 242: ...MSC8144E Reference Manual Rev 3 5 26 Freescale Semiconductor Reset ...
Page 314: ...MSC8144E Reference Manual Rev 3 8 24 Freescale Semiconductor General Configuration Registers ...
Page 414: ...MSC8144E Reference Manual Rev 3 10 14 Freescale Semiconductor MSC8144E SC3400 DSP Subsystem ...
Page 452: ...MSC8144E Reference Manual Rev 3 11 38 Freescale Semiconductor Internal Memory Subsystem ...
Page 520: ...MSC8144E Reference Manual Rev 3 12 68 Freescale Semiconductor DDR SDRAM Memory Controller ...
Page 1070: ...MSC8144E Reference Manual Rev 3 21 28 Freescale Semiconductor Timers ...