
® 16k CXP
45
UM 16k CXP – Indice E - 06/13
e2v semiconductors SAS 2013
7
APPENDIX A: Test Patterns
7.1
Test Pattern 1: Vertical wave
The Test pattern 1 is a vertical moving wave : each new line will increment of 1 gray level in regards with the
previous one.
In 12 bits the level reaches 4095 before switching down to 0
In 8 bits the level reaches 255 before switching down to 0
7.2
Test Pattern 2: Fixed Horizontal Ramps
7.2.1
In 8 bits (Full) format – No Binning (16384 pixels)
0
50
100
150
200
250
0
2048
4096
6144
8192
10240
12288
14336
An increment of 1 LSB is made every 16 pixels
When it reaches 255, turns back to 0 and starts again
14
15
16
17
18
19
250
260
270
280
290