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12–2
Testability and Diagnostics
29 September 1997 – Subject To Change
Test Interface
12.2 Test Interface
The 21164PC test interface supports a serial ROM interface, a serial diagnostic ter-
minal interface, and an IEEE 1149.1 test access port. These ports are available and
set to normal test interface mode when port_mode_h<1:0>=00. Driving these pins
to a value of anything other than 00 redefines all other test interface pins and invokes
special factory test modes not covered in this document.
The SROM port is described in Section 7.4 and the serial terminal port is described
in Section 7.5.
12.2.1 IEEE 1149.1 Test Access Port
Pins tdi_h, tdo_h, tck_h, tms_h, and trst_l constitute the IEEE 1149.1 test access
port. This port accesses the 21164PC chip’s boundary-scan register and chip tristate
functions for board-level manufacturing test. The port also allows access to factory
manufacturing features not described in this document. The port is compliant with
most requirements of IEEE 1149.1 test access port.
Compliance Enable Inputs
Table 12–2 shows the compliance enable inputs and the pattern that must be driven
to those inputs in order to activate the 21164PC IEEE 1149.1 circuits.
Exceptions to Compliance
The 21164PC is compliant with IEEE Standard 1149.1—1993, with two exceptions.
Both exceptions provide enhanced value to the user.
1.
trst_l pin
The optional trst_l pin has an internal pull-down, instead of a pull-up as required
by IEEE 1149.1 (non-complied spec 3.6.1(b) in IEEE 1149.1–1993). The trst_l
pull-down allows the chip to automatically force reset to the IEEE 1149.1 cir-
cuits in a system in which the IEEE 1149.1 port is unconnected. This may be
considered a feature for most system designs that use IEEE 1149.1 circuits
solely during module manufacturing.
Table 12–2 Compliance Enable Inputs
Input
Compliance Enable Pattern
port_mode_h<1:0>
00
dc_ok_h
1