5–54
Internal Processor Registers
29 September 1997 – Subject To Change
Memory Address Translation Unit (MTU) IPRs
5.2.22 Dcache Test Tag (DC_TEST_TAG) Register (214)
DC_TEST_TAG is a read/write register used exclusively for testing and diagnostics.
When DC_TEST_TAG is read, the value in the DC_TEST_CTL register is used to
index into the Dcache. The value in the tag, tag parity, valid, and data parity bits for
that index are read out of the Dcache and loaded into the DC_TEST_TAG_TEMP
register. A zero value is returned to the integer register file (IRF). If BANK0 is set,
the read operation is from Dcache bank0. Otherwise, the read operation is from
Dcache bank1.
When DC_TEST_TAG is written, the value written to DC_TEST_ TAG is written to
the Dcache index referenced by the value in the DC_TEST_CTL register. The tag,
tag parity, and valid bits are affected by this write operation. Data parity bits are not
affected by this write operation (use DC_MODE<02> and force hit modes). If
BANK0 is set, the write operation is to Dcache bank0. If BANK1 is set, the write
operation is to Dcache bank1. If both are set, both banks are written.
Figure 5–46 and Table 5–23 describe the DC_TEST_TAG register format.
Figure 5–46 Dcache Test Tag (DC_TEST_TAG) Register
PCA020
31
00
63
32
07
10
11
12
13
03
04
05
06
01
33
TAG_PARITY
OW0_VALID
OW1_VALID
IGN
02
TAG<32:13>
TAG<32:13>
IGN
IGN