CY7C291A
CY7C292A/CY7C293A
3
Electrical Characteristics
Over the Operating Range
[3,4]
7C291A-20
7C292A-20
7C293A-20
7C291A-25
7C292A-25
7C293A-25
7C291AL-25
7C292AL-25
7C293AL-25
Parameter
Description
Test Conditions
Min.
Max.
Min.
Max.
Min.
Max.
Unit
V
OH
Output HIGH Voltage
V
CC
= Min., I
OH
=
−
4.0 mA
2.4
2.4
2.4
V
V
OL
Output LOW Voltage
V
CC
= Min., I
OL
= 16.0 mA
0.4
0.4
0.4
V
V
IH
Input HIGH Voltage
Guaranteed Input Logical
HIGH Voltage for All Inputs
2.0
V
CC
2.0
V
CC
2.0
V
CC
V
V
IL
Input LOW Voltage
Guaranteed Input Logical
LOW Voltage for All Inputs
0.8
0.8
0.8
V
I
IX
Input Load Current
GND < V
IN
< V
CC
−
10
+10
−
10
+10
−
10
+10
µ
A
V
CD
Input Diode Clamp Voltage
Note 4
I
OZ
Output Leakage Current
GND < V
OUT
< V
CC
,
Output Disabled
−
10
+10
−
10
+10
−
10
+10
µ
A
I
OS
Output Short Circuit
Current
[5]
V
CC
= Max., V
OUT
= GND
−
20
−
90
−
20
−
90
−
20
−
90
mA
I
CC
V
CC
Operating Supply
Current
V
CC
= Max.,
I
OUT
= 0 mA
Com’l
120
90
60
mA
Mil
120
I
SB
Standby Supply Current
(7C293A Only)
V
CC
= Max.,
CS
1
= V
IH
Com’l
40
30
30
mA
Mil
40
V
PP
Programming Supply Voltage
12
13
12
13
12
13
V
I
PP
Programming Supply Current
50
50
50
mA
V
IHP
Input HIGH Programming
Voltage
3.0
3.0
3.0
V
V
ILP
Input LOW Programming
Voltage
0.4
0.4
0.4
V
Notes:
3.
See the last page of this specification for Group A subgroup testing information.
4.
See the “Introduction to CMOS PROMs” section of the Cypress Data Book for general information on testing.
5.
For test purposes, not more than one output at a time should be shorted. Short circuit test duration should not exceed 30 seconds.
