10
CAMELIA 4M Digital Camera
5301C–IMAGE–03/04
Image Grade
Operating conditions
•
Room temperature: 20
°
C
•
Integration time in darkness: 100 ms
•
Light source: Halogen 3200K with BG38 (2 mm thick) IR cut-off with f/4 aperture
•
Test under illumination at 50% saturation level
Definitions
A column defect is a one-pixel-wide column with more than 7 defective pixels. The col-
umn's height is constant with the light level.
Z1 is a square area whose size is 0.5 (H) x 0.5 (V) [1024 pixels (H), 1024 pixels (V)] cen-
tered in the image zone. Z2 corresponds to the rest of the image zone.
α
is the contrast of the defect measured as a percentage under light and in ADU in
darkness.
ADU: 12 bits correspond to 4096 ADUs.
Table 7. Specifications in Darkness
Type
Z1
Z1 + Z2
White defects in
darkness
Defects at 50% VSAT
White defects in
darkness
Defects at 50% VSAT
Blemish threshold
α
> 80 ADU
[
α]
> 20%
α
> 80 ADU
[ α]
> 20%
Maximum number of pixels
affected by blemishes
Area maximum (in pixels)
600
5 x 5
2000
5 x 5
Column threshold
α
> 5 ADU
[
α]
> 10%
α
> 5 ADU
[
α]
> 10%
Maximum number of column
defects
3
10
10
40