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MBIST Instruction Register
3-4
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3.2
Field descriptions
The following sections describe the MBIR fields:
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Read Latency and Write Latency fields, MBIR[42:40] and MBIR[45:43]
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MaxXAddr and MaxYAddr fields, MBIR[35:32] and MBIR[31:28]
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ArrayEnables field, MBIR[23:4]
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3.2.1
Pattern field, MBIR[57:52]
The MBIST controller is supplied with industry-standard pattern algorithms and a
bit-line stress algorithm. You can group algorithms together to create a specific memory
test methodology for your product.
Table 3-1 describes the supported algorithms, and
describes their use. The N values in the table indicate the number of RAM accesses per
address location and give an indication of the test time when using that algorithm.
Table 3-1 Pattern field encoding
Pattern
MBIR[57:52]
Algorithm name
N
Description
b000000
Write Solids
1N
Write a solid pattern to memory
b000001
Read Solids
1N
Read a solid pattern from memory
b000010
Write Checkerboard
1N
Write a checkerboard pattern to memory
b000011
Read Checkerboard
1N
Read a checkerboard pattern from memory
b000100
March C+ (x-fast)
14N
March C+ algorithm, incrementing X-address first
b001011
March C+ (y-fast)
14N
March C+ algorithm, incrementing Y-address first
b000101
Fail Pattern
6N
Tests memory failure detection capability
b000110
Read Write March (x-fast)
6N
Read write march pattern, incrementing X-address first
b000111
Read Write March (y-fast)
6N
Read write march pattern incrementing Y-address first