Agilent Technologies E5070B, User Manual

Page: 332 / 769

326 Chapter 8
Frequency-Offset Measurement (Option 008)
Measurement of Harmonic Distortion
Measurement of Harmonic Distortion
Using the frequency-offset function and absolute measurement function in combination
allows you to measure harmonic distortion of nonlinear devices such as mixers and
amplifiers.
Measurement flow
Table 8-4 Measurement Flow of Harmonic Distortion
Item Description
"1. Setting
Frequency-Offset" on page
313 Sets frequency-offset function
"2. Implementing Receiver
Calibration" on page 327 Implements receiver calibration
"3. Setting Absolute
Measurement Parameters"
on page 327 Sets absolute measurement parameters
• Procedures for setting absolute measurement parameters
"4. Harmonic Distortion
Measurement" on page 328 Implements harmonic distortion measurement
• Connection of DUT
• Procedures for setting measurement parameters
Table 8-4 shows the measurement flow.
1. Setting Frequency-Offset Function
The frequency-offset function allows you to make measurements while the frequencies are
different at each test port. In this case, measurement is done by using the setting example
for measurement frequency in Figure 8-12. For the setting of frequency-offset sweep, see
"1. Setting Frequency-Offset" on page 313.