11
ESD Event Detection Sensor
The 3M
™
EM Eye Meter CTM048 will help you detect most ESD events. This
will help you make sound decisions in tackling what may have been a daunting
task. The EM Eye Meter CTM048 detects the magnitude of events and using
the filters built into the unit. It can provide approximate values for some ESD
Events for models (CDM, MM, HBM) using proprietary algorithms. Switching
between any of the modes will give you immediate data analysis. Solving ESD
problems requires data; a before-and-after analysis of data may now be measured
and used to tailor ESD control programs.
CDM Mode
MM Mode
HBM Mode
Raw Input Mode
In IC testing, ICs
that are sliding
through tubes may
be charged up. Once
the lead touches the
metal tracks, a CDM
event can occur.
A moving, un-
grounded cart may
accumulate charges
in its path. As it ap-
proaches a metallic
worktable and bumps
into it, a discharge
may occur and may
adversely affect
nearby products or
instruments.
In IC testing, opera-
tors that are handling
an IC (i.e. fixing
bent leads) may be
discharging through
the IC.
For engineers who
want to simply ana-
lyze raw ESD signals
for further analysis,
the Raw Input mode
provides actual volt-
ages received by an
antenna.
In feeder bowls
where the ICs are ar-
ranged for sorting or
orientation, voltages
may be induced by
the vibrating bowl.
In using a bad solder-
ing iron, induced
voltages may cause
discharges to the
components mounted
into the PCB. Use
grounded tools and
confirm that no
ESD events will be
detected by using the
MM mode.
During picking up
of an IC by a person
not properly wearing
a wrist strap, use
the EM Eye Meter to
alarm the operator of
such events.
