Hardware Development Guide of Module Product
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6.3
Reliability Testing Environment
The reliability test includes the vibration test, high/low-temperature running,
high/low-temperature storage and temperature shock experiment test. Refer to
Table 6-4 for the specific parameters.
Table 6-4 Reliability Features
Testing Item
Testing Condition
Testing
Standard
Random
vibration
Frequency range: 5-20Hz,
PSD:1.0m2/s3
Frequency range: 20-200Hz,
-3dB/oct
3 axis, 1 hour for each axis
IEC 68-2-6
Temperature
shock
Low temperature: -40°C ±2°C
High temperature: +80°C ±2°C
Temperature changing period: less
than 30seconds
Test duration: 2 hours
Cycle: 10
IEC 68-2-14 Na
High-temperature
running
Normal high temperature: 75
°
C
Extreme high temperature: 85
°
C
Duration: 24 hours
ZTE standard
Low-temperature
running
Normal low temperature: -20
°
C
Extreme low temperature: -40
°
C
Duration: 24 hours
ZTE standard
High temperature
& high humidity
Temperature: +60°C
Humidity: 95%
Duration: 48 hours
ZTE standard
High temperature
storage:
Temperature: 85
°
C
Duration: 24 hours
IEC 68-2-1 Ab
Low temperature
storage:
Temperature: -40
°
C
Duration: 24 hours
IEC 68-2-2 Bb
