5 Operation | 5.5 Setting Up for Reflected Light Techniques
ZEISS
4. Swivel the DIC compatible objective into the
beam path.
5. Slide the TIC slider
1
into the 6x20 mm
compensator slot.
3
1
2
à
Chromatic interference stripes appear in the field of view.
6. Move the black interference stripe by sight to the middle of the field of view. Use the set-
ting screw
3
.
7. To choose the structure to be measured, turn
the setting wheel
2
on the TIC slider until
the interference stripes are vertical to the direc-
tion in which the sample is broken down.
8. Determine the values for a (distance between the interference stripes) and b (offset of the
interference stripes along the step) in the interference image. Use an eyepiece reticle mi-
crometer or a micrometer eyepiece.
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Instruction Manual ZEISS Axioscope 5, Axioscope 5/7 MAT | en-US | Rev. 13 | 430035-7344-001