Axio Imager 2
INSTRUMENT DESCRIPTION
ZEISS
Stage micrometers and eyepiece reticles
01/2016
430000-7544-001
29
Symbol
Designation, technical data
Cat. No.
Universal calibration slide D=0
Without cover glass; positive version
−
Precision retrieval of objects
−
Location of the reference mark relative to the
left and
−
upper edge of specimen slide X = 38 mm /
Y = 13 mm,
±
5 µm
−
50mm line for parallelism check
−
Stage micrometer-function "Micro" and
"Stemi":
−
5 lines at 1 mm intervals in y direction
−
100 lines at 1/100 mm intervals in y
direction
−
25 lines at 1 mm intervals in x direction
−
50 lines at 1/10 mm intervals in x direction
−
Circular areas with diameter of
2.5/1.0/0.5/0.1/0.05/0.01 mm
−
Concentric rectangles 8x6/4x3/2x1.5/
1x0.75 mm
474029-9010-000
Crossline micrometer 14:140 / d = 26 mm
Graduation length = 14 mm
Increments = 0.1 mm
Graduation tolerance
≤
0.001 mm
454060-0000-000
Eyepiece reticle / d = 26 mm
For the alignment of the reticle using alignment
specimen.
474064-0000-000
Crossline micrometer 10:100 / d = 26 mm
Graduation length = 10 mm
Increments = 0.1 mm
Graduation tolerance
≤
0.001 mm
474066-9901-000