TappingMode AFM
Basic TappingMode AFM Operation
Rev. D
Dimension 3100 Manual
135
9.2.6 Focus Surface
1. Select
Stage
>
Focus Surface
or click the
Focus Surface
icon.
2. In the
Focus On
box, select
Choose either surface
or
Tip reflection
. If the sample is very
flat or reflective, choose
Tip reflection
.
3. Focus on the sample surface using the trackball with the bottom left button depressed.
Note:
You may need to adjust the illumination and zoom to clearly see the probe.
9.2.7 Cantilever Tune
This section describes the steps required to find the resonance peak of the cantilever and adjust the
oscillation voltage so the cantilever vibrates at an appropriate amplitude. A range of oscillation
frequencies are applied to the cantilever to determine the frequency which produces the largest
response (the resonant frequency). In most instances, the resonant peak has a sharp Gaussian
distribution but at times the peak can be ragged. The system tolerates some deviation in the shape of
the peak.
•
Select
View
>
Sweep
>
Cantilever Tune
, or click on the
Cantilever Tune
icon.
The initial
Cantilever Tune
panel appears with the
Frequency Sweep
(a plot of
cantilever response as a function of applied oscillation frequency) on the display
monitor.
•
Choose either the manual or automatic tuning method (see
and
CAUTION:
Use caution when focussing on the sample surface. Moving the
head too quickly while focussing can cause the tip to crash, which
may damage the tip and/or sample.
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