Veeco Dimension 3100, Руководство пользователя

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Head, Probe, & Sample Preparation
Basic AFM Operation
Rev. D Dimension 3100 Manual 103
Figure 7.2b Cantilever Holder Stand (top view)
Note: You may install the AFM cantilever holder in only one orientation because the
pins are asymmetrical.
7.2.4 Load the Cantilever Holder
Contact Mode AFM
Silicon nitride substrates are used for SPM operation in Contact Mode AFM. Silicon nitride
substrates consist of a cantilever integrated with a sharp tip on the end. For Contact Mode AFM
imaging, the cantilever must be soft enough to deflect very small forces and have a high enough
resonant frequency to avoid vibrational instabilities.
Note: Install silicon nitride substrates face-up so the tip points away from the AFM
cantilever holder. This ensures that the cantilever and tip face toward the sample
once the cantilever holder is mounted on the head.
To install a silicon nitride substrate on the AFM cantilever holder, complete the following:
1. Using sharp tweezers, grasp the substrate firmly on the sides and lift to free the substrate
from the wafer or gel-pack. In the gel-pack boxes the tip ends are pointing upward and do not
need to be turned over before being placed in the cantilever holder.
Note: Refer to Chapter 6 for detailed information on how to break out each substrate
from the wafer.
2. Many silicon nitride substrates have cantilevers on both ends of the substrate. If this is the
case, place the substrate under an optical microscope or magnifier and locate the substrate
you want to use.
3. Press down and slide back the spring clip of the standard AFM cantilever holder (see Figure
7.2c ).