Troxler 3430-M, Руководство по эксплуатации и инструкции

Страница: 59 / 142

Model 3430 4-11
THIN LAYER MEASUREMENTS
With the increase in thin lift overlay applications and the limitations
of conventional backscatter gauges to measure these overlays the
following method (formula) has been developed:
DT =
WD – DB
×
K
1 – K
where:
DT = Overlay density
WD = Density read by gauge
DB = Bottom layer density
K = Effect of top layer thickness on the gauge
To use the above method of overlay measurement, follow the
procedure below:
✓
Determine the density of the bottom layer (underlying material)
(
DB ).
✓
Apply the thin lift overlay.
✓
Determine the thickness of the overlay and select the
corresponding (
k ) value from Table 4-1.
✓
Measure the thin lift overlay density with the gauge in
backscatter position (
WD ).
✓
Enter all values into the above equation and calculate the
overlay density (
DT ).
ADV
A
NCE
D O
P
E
RAT
IO
N