Thermo Finnigan LCQ Deca XP Plus, Руководство по оборудованию

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User Maintenance
________________________________________________________ Frequency of Cleaning
__________________ LCQ Deca XP Plus Hardware Manual __________________
4-5
4.2 Frequency of Cleaning
The frequency of cleaning the components of the MS detector depends on the
types and amounts of samples and solvents that are introduced into the
instrument. In general, for a given sample and ionization technique, the closer
an MS detector component is to the source of the ions, the more rapidly it
becomes dirty.
•
The sample tube, API probe, ion transfer capillary bore, and spray shield
of the API source (including the ion sweep cone and the spray cone)
should be cleaned at the end of each operating day to remove any residual
salts from buffered mobile phases or other contamination that might have
accumulated during normal operation. Refer to the topics Flushing the
Sample Transfer Line, Sample Tube, and API Probe and Flushing the
Spray Shield, Ion Sweep Cone, Spray Cone, and Ion Transfer
Capillary on page 4-6 and page 4-8, respectively.
•
The tube lens and skimmer of the API source become dirty at a slower
rate than the API probe, spray shield, and ion transfer capillary. Refer to
the topic Maintaining the API Stack on page 4-27.
• The ion optics and the mass analyzer become dirty at a rate significantly
slower than the API source. Refer to the topic Cleaning the Ion Optics
and Mass Analyzer Parts in Chapter 5.
•
Clean the electron multiplier and conversion dynode whenever you
remove the top cover plate of the vacuum manifold by blowing them with
a clean, dry gas. Refer to the topic Cleaning the Ion Detection System
in Chapter 5.
When the performance of your system decreases significantly due to
contamination, clean the components of the MS detector in the following
order:
• Clean the API probe, spray shield, and ion transfer capillary
•
Clean the tube lens and skimmer
• Clean the ion optics and mass analyzer