Texas Instruments UCC5870QDWJEVM-026, Руководство пользователя, Страница: 5 / 34

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Description
5 SLUUC64 – June 2020
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UCC5870QDWJEVM-026 Evaluation Module User’s Guide
2 Description
The UCC5870-Q1 evaluation kit can be used standalone to test the UCC5870-Q1 driver with 100-nF
capacitor dummy load soldered on the board, it can also be used to drive IGBT module directly for high
power test. The MCU daughter board is populated with 3-position headers for flexibility in configuring
different SPI communication methods. The EVM PCB layout is optimized with minimal loop area in the
input and output paths for the best performance of high power test.
2.1 Features
• 15-A peak split sink/source drive current for fast turn ON and turn OFF time
• Driver output voltages by default are +15V/-8V with 12-V input supply
• 3750-V
RMS
one minute isolation per UL 1577 for UCC5870-Q1
• 3000-V
RMS
one minute isolation for the flyback transformer
• > 8-mm creepage distance between primary and secondary
• Desat short-circuit protection and active Vce clamp
• Active miller clamp using internal or external FET
• Fault feedback and reset
• ADC for temperature sensing and DC bus voltage sensing
• Primary and secondary ASC
• SPI based device reconfiguration, verification, supervision and diagnosis
• Compatible with 820A 750V IGBT module FS820R08A6P2B
2.2 I/O Description
Table 1. I/O Description
PINS DESCRIPTION
TP–1 +12V supply
TP–2 Primary GND1 input
TP–3 +4.5V supply
TP–4 Primary GND1 input
TP–5 Test point for gate (use for low voltage test only)
TP–6 Test point for source (use for low voltage test only)
TP–7 Driver VCC2 input (use for low voltage test only)
TP–8 Driver secondary GND2 input (use for low voltage test only)
TP–9 Driver VEE2 input (use for low voltage test only)
J1 C2 of the IGBT module (use for high voltage test only)
J2 G2 of the IGBT module (use for high voltage test only)
J3 T11 of the IGBT module (use for high voltage test only)
J4 T12 of the IGBT module (use for high voltage test only)
J5 E2 of the IGBT module (use for high voltage test only)
J6 C1 of the IGBT module (use for high voltage test only)
J7 G1 of the IGBT module (use for high voltage test only)
J8 E1 of the IGBT module (use for high voltage test only)
J9 Connector for MCU daughter card
J17 Test pin (use for low voltage test only)
J18 Test pin (use for low voltage test only)
J19 Test pin (use for low voltage test only)
J20 Test pin (use for low voltage test only)
J21 Secondary ASC (use for low voltage test only)
J22 Test pin (use for low voltage test only)