Texas Instruments TPS40345EVM-353, Руководство пользователя, Страница: 5 / 23

www.ti.com
Connector and Test Point Descriptions
5 SNVU588 – November 2017
Submit Documentation Feedback
Copyright © 2017, Texas Instruments Incorporated
TPS40345EVM-353 Evaluation Module
4 Connector and Test Point Descriptions
4.1 Enable Jumper (JP2)
The TPS40345EVM-353 is designed with a Disable Jumper (JP2) using a 0.1-inch spacing header and
shunt. Installing a shunt in the JP2 position connects the EN/SS pin to GND, discharges the soft-start
capacitor, and disables the TPS40304 controller. This forces the output into a high-impedance state
(approximately 20k
Ω to GND).
4.2 Frequency Spread Spectrum – FSS Jumper (JP1)
The TPS40345EVM-353 is designed with a frequency spread spectrum (FSS) enable jumper (JP1) using
a 0.1" spacing header and shunt. Installing a shunt in the JP1 position connects the EN/SS pin to BP via a
267-k
Ω
resistor (R10) to enable frequency spread spectrum.
FSS modulates the switching frequency to ±10% of the nominal value at 30 kHz to reduce EMI at the
switching frequency and its harmonics, however there may be a 30-kHz component to the output ripple
(see
Figure 10 ).
The TPS40345EVM-353 does not dynamically monitor the JP1 status for programming FSS. The
TPS40345EVM-353 must be disabled via JP2 or powered down by reducing VIN to less than 3 V to
remove or install JP1.
4.3 Test Point Descriptions
Table 2. Test Point Descriptions
TEST
POINT
LABEL USE SECTION
TP1 VIN Measurement test point for input voltage 4.3.1
TP2 GND Ground test point for input voltage 4.3.1
TP3 VOUT Measurement test point for output voltage 4.3.1
TP4 GND Ground test point for output voltage 4.3.2
TP5 CHB Measurement test point for channel B of loop response 4.3.3
TP6 SGND Ground test point for channel B of loop response 4.3.3
TP7 CHA Measurement test point for channel A of loop response 4.3.3
TP8 SGND Ground test point for channel A of loop response 4.3.3
TP9 SGND Ground test point for error amplifier measurements 4.3.4
TP10 COMP Measurement test point for error amplifier output voltage 4.3.4
TP11 FB Measurement test point for error amplifier input voltage 4.3.4
TP12 HDRV Measurement test point for high-side gate driver voltage 4.3.5
TP13 SW Measurement test point for switching node voltage 4.3.5
TP14 LDRV Measurement test point for low-side gate driver voltage 4.3.5
TP15 PGND Ground test point for switch node and gate drive voltages 4.3.5
TP16 PGOOD Measurement test point for power good 4.3.6
TP17 EN/SS Measurement test point for enable / soft start 4.3.7
TP18 SGND Ground test point for power good and enable / soft start 4.3.6 and 4.3.7