27.5
JTAG and Boundary Scan
Table 27-12. JTAG Characteristics
Unit
Max
Nom
Min
Parameter Name
Parameter
Parameter
No.
MHz
10
-
0
TCK
operational clock frequency
a
F
TCK
J1
ns
-
-
100
TCK
operational clock period
T
TCK
J2
ns
-
t
TCK
/2
-
TCK
clock Low time
T
TCK_LOW
J3
ns
-
t
TCK
/2
-
TCK
clock High time
T
TCK_HIGH
J4
ns
10
-
0
TCK
rise time
T
TCK_R
J5
ns
10
-
0
TCK
fall time
T
TCK_F
J6
ns
-
-
8
TMS
setup time to
TCK
rise
T
TMS_SU
J7
ns
-
-
4
TMS
hold time from
TCK
rise
T
TMS_HLD
J8
ns
-
-
18
TDI
setup time to
TCK
rise
T
TDI_SU
J9
ns
-
-
4
TDI
hold time from
TCK
rise
T
TDI_HLD
J10
ns
35
13
-
TCK
fall to Data Valid from High-Z, 2-mA drive
T
TDO_ZDV
J11
ns
26
9
TCK
fall to Data Valid from High-Z, 4-mA drive
ns
26
8
TCK
fall to Data Valid from High-Z, 8-mA drive
ns
29
10
TCK
fall to Data Valid from High-Z, 8-mA drive with
slew rate control
ns
13
11
TCK
fall to Data Valid from High-Z, 10-mA drive
ns
14
11
TCK
fall to Data Valid from High-Z, 12-mA drive
ns
20
14
-
TCK
fall to Data Valid from Data Valid, 2-mA drive
T
TDO_DV
J12
ns
26
10
TCK
fall to Data Valid from Data Valid, 4-mA drive
ns
21
8
TCK
fall to Data Valid from Data Valid, 8-mA drive
ns
26
10
TCK
fall to Data Valid from Data Valid, 8-mA drive
with slew rate control
ns
14
12
TCK
fall to Data Valid from Data Valid, 10-mA drive
ns
15
12
TCK
fall to Data Valid from Data Valid, 12-mA drive
ns
16
7
-
TCK
fall to High-Z from Data Valid, 2-mA drive
T
TDO_DVZ
J13
ns
16
7
TCK
fall to High-Z from Data Valid, 4-mA drive
ns
16
7
TCK
fall to High-Z from Data Valid, 8-mA drive
ns
19
8
TCK
fall to High-Z from Data Valid, 8-mA drive with
slew rate control
ns
22
20
TCK
fall to High-Z from Data Valid, 10-mA drive
ns
25
20
TCK
fall to High-Z from Data Valid, 12-mA drive
a. A ratio of at least 8:1 must be kept between the system clock and
TCK
.
June 18, 2014
1824
Texas Instruments-Production Data
Electrical Characteristics