C
u
rre
n
t
(A
)
Time (ns)
15
10
5
10 %
90 %
I
p
I
p
I
30
I
60
I
p
10
20
30
40
50
60
70
80
90
100
10 %
I
p
t
r
Setup
2
SLVUBE1A – February 2018 – Revised April 2018
Copyright © 2018, Texas Instruments Incorporated
ESD224 Evaluation Module User's Guide
Table 2. IEC61000-4-2 Test Levels (continued)
Contact Discharge
Air Discharge
Class
Test Voltage [± kV]
Class
Test Voltage [± kV]
3
6
3
8
4
8
4
15
Table 3. Waveform Parameters in Contact Discharge Mode
Stress Level Step
Simulator Voltage
[kV]
Ipeak ±15% [A]
Rise Time ±25%
[nS]
Current at 30ns
±30% [A]
Current at 60ns
±30% [A]
1
2
7.5
0.8
4
2
2
4
15
0.8
8
4
3
6
22.5
0.8
12
6
4
8
30
0.8
16
8
Figure 1. Ideal Contact Discharge Waveform of the Output Current of the ESD Simulator at 4 kV
3
Setup
This section describes the intended use of the EVM. A generalized outline of the procedure given in IEC-
61000-4-2 is described here. IEC-61000-4-2 should be referred to for a more specific testing outline. Basic
configurations for collecting S-parameters, Eye Diagrams, and ESD clamping waveforms are outlined as
well.
3.1
U1 - S-Parameters 4-Port Measurement
ESD224 (U1) is configured with 4 SMA (J1 – J4) connectors to allow 4-port analysis with a vector network
analyzer. Connect Port 1 to J1, Port 2 to J2, Port 3 to J3, and Port 4 to J4. This configuration allows for
the following terminology in 4 port analysis:
•
S
11
: Return loss
•
S
21
: Insertion loss
•
S
31
: Near end cross talk
