Slew Scan Mode
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DLPU016C – April 2014 – Revised April 2019
Copyright © 2014–2019, Texas Instruments Incorporated
Operating the DLP NIRscan EVM
Figure 3-7. Example Custom Scan Raw Data
Note that the header in the download file contains many important aspects of the scan, including:
1. Method: This defaults to linescan mode at this time, referencing how the sample is taken by scanning
vertical lines across the DMD, each line representing a specific wavelength.
2. Host Date-Time: This is the date (browser date) and time the scan was taken.
3. Sample Name: This is the scan name entered on the first Custom Scan screen. If the scan name has
not been changed, the sample name defaults to default_scan.
4. Spectral Range Start: This reflects the lower scan limit entered on the previous screen
5. Spectral Range Stop: This reflects the upper scan limit entered on the previous screen
6. Number of Wavelength Points: This reflects the number entered on the previous screen
7. Digital Resolution: This reflects the number calculated on the previous screen
8. Number of Scans to Average: This reflects the number entered on the previous screen.
9. Total Measurement Time: This reflects the number calculated on the previous screen
10. The rest of the file is the actual raw data and includes:
•
DMD pattern number
•
Individual reference ADC data values for each pattern (wavelength)
•
Individual sample ADC data values for each pattern (wavelength)
After the data is saved locally on the machine running the browser, the user can return to the Custom
Scan screen.
3.3
Slew Scan Mode
From the NIRscan Home screen, clicking the
Slew Scan
icon takes the user to the Slew Scan screen
(see
).
