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Layer Settings
Waveform Type:
Standard
is typically used and
allows the peak analysis to track the major
waveform pattern.
Amplitude Modulated
may
be used in certain instances if there is a thin
layer being measured with interference from a
film substrate also present. Amplitude
Modulated will attempt to track “over” the
thicker wave curves, as the thinner layer
waveform may be superimposed over the
thicker curves. Amplitude Modulated would
create the peak analysis curve to match the
thin coating waveform.
Maximum/Minimum Evaluated Thickness:
The minimum and maximum range of thickness
that are evaluated during measurement.
Index of Refraction:
Changing the IOR will not
change the wavelength or wave graph but will
have a direct impact on the peak graph and the
resulting thickness.
Minimum Evaluated Percent:
The required
minimum percentage of readings that are
successfully evaluated for a reading to be
displayed.
Wavelength Range:
Increase or decrease the wavelength range by using the slide bars.
Beginning/Ending Wavelength:
Change the wavelength range by either typing in the values or by using
the arrow up/down buttons.
Change Specifications:
Opens the Specifications & Graph setup window allowing users to change the
following parameters such as Target Spec, Measurement Max/Min, Graph Top/Bottom, High Spec/Low
Spec limit.