LRF 7047- Integrator Manual
914929_TML_LRF7047_en_Version B
Public: 04.2019
Confidential & Proprietary
Safran Vectronix AG – All rights reserved
Page: 61/72
6.7.2 PBIT (Power built-in test) >LM,Tb,2*<CS><CR>
This command initiates a routine of power built in test to assess the modules health.
The tests shall be initiated only in the normal operating mode and specific subsystems are initiated.
No laser radiation is emitted during this routine.
PBIT command and response
Command
Inputs
Description
>LM,Tb,2*<CS><CR>
>LM,Tb,2*D9
<0D>
Activates Power Built In Test routine.
Example.
Response
Outputs
Description
>LM,Tb,name,test1,test2*<CS><CR>
>LM,Tb,PBIT,FF,FF*46
<0D>
Response of LRF module to the PBIT request.
Example.
Parameters Value
Description
name
test1
test2
PBIT
FF
FF
Name.
Test result expressed in hexadecimal.
Test result expressed in hexadecimal.
testresult1
11111111
(
FF
)
Test result1 converted to binary (1 good, 0 error).
Bit 7: 3.3 V power supply (for dual power supply only).
Bit 6: +5 V (VBAT) under voltage
test
.
Bit 5: +5 V (VBAT) over voltage
test.
Bit 4: Power supply for analog receiver unit
under voltage
test.
Bit 3: Power supply for analog receiver unit
over voltage
test.
Bit 2: Power supply for Rx-board under voltage
test.
Bit 1: Power supply for Rx-board
over voltage
test.
Bit 0: Power supply for Tx-board under voltage
test.
testresult2
11111111
(
FF
)
Test result2 converted to binary (1 good, 0 error).
All Bits: Reserved.
Bit 0: GO/NOGO status (1
GO, 0
NO GO)
GO = all tests passed.
NO GO = at least one test failed.
Table 24: PBIT command
Example of a PBIT command transaction:
Host
LRF Module
Command frame:
>LM,Tb,2*D9
<0D>
LRF Module
Host
Acknowledge frame:
>AC*84
<0D>
Response frame:
>LM,Tb,PBIT,FE,FE*44
<0D>
Prompt:
<