Rigaku 2080A211, Инструкция по эксплуатации, Страница: 13 / 115

Incident optics system
SmartLab: Automated Multipurpose X-ray Diffractometer
5
Incident optics system
The following mechanisms enable switching between para-focusing optics,
parallel beam optics, 2- or 4-bounce monochromator high resolution optics,
small-angle scattering optics, and micro area measurement optics.
Additionally, for various in-plane measurements, a parallel slit collimator (PSC)
that controls resolution in the in-plane direction can be installed on the incident
parallel slit adaptor and 2-bounce monochromator.
• CBO unit
To select the incident beam.
• Standard incident optics unit
To select Soller slit, 2-bounce monochromator (with Soller slit), or 4-bounce
monochromator.
• Standard incident slit box
Equipped with variable slit and length-limiting slit.
Receiving optics system
The following mechanisms enable selection of a broad range of resolution
characteristics for specific purposes.
A parallel slit analyzer (in-plane PSA) that increases the resolution in the
in-plane direction can be used for various in-plane measurements.
• Standard receiving slit box # 1
For installation of a K β x-ray filter for measurements using para-focusing
optics.
• Standard receiving optics unit # 1
For installation of various analyzers.
• Standard receiving optics unit # 2
For installation of parallel slit such as Soller slits.
• Standard receiving slit box # 2
With a slit position alignment mechanism.
• Standard attenuator
For the adjustment of x-ray intensity.
Optics switching system
Optics alignment results are retained by SmartLab Guidance. When you change
optics the previously stored alignment results are used eliminating the need for
realignment.