Remote Commands to Perform Measurements with I/Q Data
R&S
®
FSV/A3000 I/Q
Analyzer
195
User Manual 1178.8536.02 ─ 01
[SENSe:]IQ:FFT:LENGth
<NoOfBins>
Defines the number of frequency points determined by each FFT calculation. The more
points are used, the higher the resolution in the spectrum becomes, but the longer the
calculation takes.
Parameters:
<NoOfBins>
integer value
Range:
3 to 524288
*RST:
4096
Example:
IQ:FFT:LENG 2048
Manual operation:
See
[SENSe:]IQ:FFT:WINDow:LENGth
<NoOfFFT>
Defines the number of samples to be included in a single FFT window when multiple
FFT windows are used.
Parameters:
<NoOfFFT>
integer value
Range:
3 to 1001
*RST:
1001
Example:
IQ:FFT:WIND:LENG 500
Manual operation:
See
[SENSe:]IQ:FFT:WINDow:OVERlap
<Rate>
Defines the part of a single FFT window that is re-calculated by the next FFT calcula-
tion.
Parameters:
<Rate>
double value
Percentage rate
Range:
0 to 1
*RST:
0.75
Example:
IQ:FFT:WIND:OVER 0.5
Half of each window overlaps the previous window in FFT calcu-
lation.
Manual operation:
See
[SENSe:]IQ:FFT:WINDow:TYPE
<Function>
In the I/Q Analyzer you can select one of several FFT window types.
Parameters:
<Function>
BLACkharris
Blackman-Harris
Configuring I/Q Analyzer Measurements