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WCDMA Multi Evaluation Measurement
R&S
®
CMW-KG4xx/-KM4xx/-KS4xx
571
User Manual 1173.9657.02 ─ 11
The traces and bar graphs are described in the "Detailed Views" sections.
3.2.6.2
Detailed Views: Modulation, CDP and CDE
This section applies to the following detailed views:
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Error Vector Magnitude (multislot and vs chip)
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Magnitude Error (multislot and vs chip)
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Phase Error (multislot and vs chip)
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Frequency Error
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Code Domain Power (CDP) vs Slot
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Code Domain Error (CDE) vs Slot
Each of the detailed views shows one diagram per carrier and a statistical overview of
single-slot results.
Fig. 3-14: WCDMA multi evaluation: EVM
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Error Vector Magnitude, Magnitude Error, Phase Error and Frequency Error
The diagrams cover a time interval of up to 120 slots. The "Current" traces contain
one measurement result per slot or half-slot, which is calculated as the average of
the measured quantity of all samples in the slot or half-slot, excluding a 25 μs
guard period at the beginning and at the end.
●
Error Vector Magnitude vs Chip, Magnitude Error vs Chip, and Phase Error vs Chip
The diagrams cover all 2560 chips of the "Preselected Slot" and contain one mea-
surement result per chip.
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CDP vs Slot and CDE vs Slot
General Description
深圳德标仪器
135-1095-0799