ON Semiconductor NCN49597, Руководство пользователя, Страница: 4 / 28

NCN49597
http://onsemi.com
4
Normal Operating Conditions
Operating ranges define the limits for functional operation and parametric characteristics of the device as described in the
Normal Operating Conditions section and for the reliability specifications as listed in Detailed Hardware Description section.
Functionality outside these limits is not implied.
Total cumulative dwell time outside the normal power supply voltage range or the ambient temperature under bias, must be
less than 0.1% of the useful life as defined in Detailed Hardware Description section.
Table 3. OPERATING RANGES
Rating Symbol Min Max Unit
Power supply voltage range V
DD
3.0 3.6 V
Ambient Temperature T
A
− 25 80 ° C
Extended Ambient Temperature on special request T
A
− 40 80 ° C
PIN DESCRIPTION
QFN Packaging
AMIS49597
1
2
3
4
5
6
7
8
9
10
11
12
13
26 25 24 23 22 21 20 19 18 17 16 15 14
39
38
37
36
35
34
33
32
31
30
29
28
27
40 41 42 43 44 45 46 47 48 49 50 51 52
NC
RE
F
_O
U
T
NC
RX
_IN
RX
_O
U
T
VSS
A
VD
D
A
NC NC
AL
C
_IN
TX
_O
U
T
NC NC
IO
8
IO
9
TX
D
/P
R
E
S
XI
N
XO
U
T
VD
D
1V
8
VS
S VD
D TX
D IO
10
RX
D SC
K SD
I
IO7
IO6
TMS
TCK
TDI
TDO
IO0/RX_DATA
IO5
IO4
IO3
NC
M50Hz_IN
SDO
CSB
T_REQ
SEN
BR1
BR0
CRC
IO11
TEST
NC
NC
TRST
RES
TX_EN
Figure 2. QFN Pin − out of NCN49597 (Top view)
Table 4. NCN49597QFN PIN FUNCTION DESCRIPTION
Pin No. Pin Name I/O Type Description
1 ZC_IN In A 50/60 Hz input for mains zero cross detection
3..5, 12..15,
23, 34
IO3 .. IO11 In/Out D, 5V Safe General Purpose I/O
6 RX_DATA Out D, 5V Safe Data reception indication (open drain output)
7 TDO Out D, 5V Safe Test data output
8 TDI In D, 5V Safe Test data input (internal pull down)
9 TCK In D, 5V Safe Test clock (internal pull down)
10 TMS In D, 5V Safe Test mode select (internal pull down)
11 TRSTB In D, 5V Safe Test reset bar (internal pull down, active low)