Omron CJ1W-V680C11, Руководство пользователя

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SECTION 5
Parameter
Settin
gs
in DM
Area
SECTION 5
ID Sensor Unit Functions
97
RFID System
User's Manual
Test Settings
The test settings are used to set the operation, Antenna, and number of test bytes used in Test Mode.
First word allocated to Unit in DM Area: m = 100
×
Unit number
Run/Test Switching Method Setting
You can switch between Run Mode and Test Mode by using the test switch or by using bit 15 of CIO
n+0.
First word allocated to Unit in DM Area: m = 100
×
Unit number
After setting DM Area data with the Support Software, reset the power supply to the PLC or turn ON the Special I/O Unit
Restart Bit. The DM Area settings will be transferred to the ID Sensor Unit when the power supply turns ON or when the
Special I/O Unit Restart Bit is turned ON.
RF Tag Memory Setting
This setting can be used to set the RF Tag memory map to the map that is used with ID Controllers for
Heat-resistant RFID Systems (V680-CA1D/-CA2D).
DM Area address Bit No. Type Description Setting value
m+50
08 to 15
Test Settings
(Both Antennas 1 and 2) Test Operation 00: Communications test
A0: Range level
B0: Read speed level
B1: Write speed level
C0: Noise level
C1: Communications success rate
00 to 07
Test Antenna 01: Antenna 1
02: Antenna 2
m+51 00 to 15 Number of Test Bytes 0000 to 0800 hex (bytes)
DM Area address Bit No. Type Description Set value
m+80
00 to
03
Run/Test Switching Method
Setting
(Both Antennas 1 and 2)
Run/Test Switching
Method Setting 1: CPU Unit
0: Test switch
DM Area address Bit No. Type Description Set value
m+81
00 to
03
RF Tag Memory Setting
(Both Antennas 1 and 2)
RF Tag Memory Setting
1: CA1D Mode
0: Standard Mode