Olympus EPOCH 650, Руководство пользователя

Страница: 277 / 362

DMTA-10055-01EN, Rev. A, February 2015
Software Features and Options 265
4. Move the transducer towards the potential defect until the peak has dropped to ½
the value of A
max
(in % FSH) on the leading edge of the signal.
5. Press the T
1
key (P2) to collect the 6dB drop position of the leading peak and
assign this value as T
1
.
6. Move the transducer away from the potential defect until the peak has dropped to
½ the value of Amax (in % FSH) on the trailing edge of the signal.
7. Press the T
2
key (P3) to collect the 6 dB drop position of the trailing peak and
assign this value as T
2
.
The crack size indication appears at the top right corner of the live A-Scan display.
8. To inspect a separate crack, or to collect new data for the same crack, press P6 to
Clear the current data and follow the steps above to inspect again.
At any time during an inspection in either Envelope mode or Manual mode, it is
possible to re-calibrate the instrument. Press the
RE-CAL function key (F5) to enter
the calibration mode and follow the steps defined in “Envelope Mode Calibration” on
page 258 and “Calibration” on page 143 to re-calibrate.
11.6 Waveform Averaging
The Waveform Averaging software option allows the live A-scan view to represent an
average of successively acquired A-scans. Waveform averaging improves signal-to-
noise ratio when static flaws are detected.
You should not use waveform averaging when dynamically scanning a test material
for flaws. Doing so will average out the high peak flaw echoes with the lower
amplitude clean signals that surround it, making it harder to identify specific flaw
signals.
You can select the precision of the averaging, choosing between 2X , 4X , 8X , 16X , or
32X averaging to remove spurious noise signals from the A-scan while maintaining
relevant signals.