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Chapter 36 Nexus Development Interface (NDI)
MPC5602P Microcontroller Reference Manual, Rev. 4
Freescale Semiconductor
873
36.9
Debug support overview
Internal debug support in the e200z0h core allows for software and hardware debug by providing debug
functions, such as instruction and data breakpoints and program trace modes. For software based
debugging, debug facilities consisting of a set of software accessible debug registers and interrupt
mechanisms are provided. These facilities are also available to a hardware based debugger which
communicates using a modified IEEE 1149.1 Test Access Port (TAP) controller and pin interface. When
hardware debug is enabled, the debug facilities controlled by hardware are protected from software
modification.
Software debug facilities are built on Power Architecture technology. e200z0h supports a subset of these
defined facilities. In addition to the facilities built on Power Architecture technology, e200z0h provides
additional flexibility and functionality in the form of linked instruction and data breakpoints, and
sequential debug event detection. These features are also available to a hardware-based debugger.
The e200z0h core provides support for a Nexus real-time debug module. Real-time debugging in an
e200z0h-based system is supported by a Nexus class 2, 3, or 4 module.
36.9.1
Software Debug Facilities
e200z0h provides debug facilities to enable hardware and software debug functions, such as instruction
and data breakpoints and program single stepping. The debug facilities consist of a set of debug control
registers (DBCR0–2, DBCR4, DBERC0), a set of address compare registers (IAC1, IAC2, IAC3, IAC4,
DAC1, and DAC2), a set of data value compare registers (DVC1, DVC2), a Debug Status Register
(DBSR) for enabling and recording various kinds of debug events, and a special Debug interrupt type built
into the interrupt mechanism. The debug facilities also provide a mechanism for software-controlled
processor reset in a debug environment.
Software debug facilities are enabled by setting the internal debug mode bit in Debug Control register 0
(DBCR0
IDM
). When internal debug mode is enabled, debug events can occur, and can be enabled to record
exceptions in the Debug Status register (DBSR). If enabled by MSR
DE
, these recorded exceptions cause
Debug interrupts to occur. When DBCR0
IDM
is cleared, (and DBCR0
EDM
is cleared as well), no debug
events occur, and no status flags are set in DBSR unless already set. In addition, when DBCR0
IDM
is
cleared (or is overridden by DBCR0
EDM
being set and DBERC0 indicating no resource is “owned” by
software) no Debug interrupts will occur, regardless of the contents of DBSR. A software Debug interrupt
handler may access all system resources and perform necessary functions appropriate for system debug.
36.9.1.1
Power Architecture technology compatibility
The e200z0h core implements a subset of the Power Architecture solutions internal debug features. The
following restrictions on functionality are present:
•
Instruction address compares do not support compare on physical (real) addresses.
•
Data address compares do not support compare on physical (real) addresses.
Содержание SAFE ASSURE Qorivva MPC5601P
Страница 2: ...MPC5602P Microcontroller Reference Manual Rev 4 2 Freescale Semiconductor ...
Страница 4: ...MPC5602P Microcontroller Reference Manual Rev 4 4 Freescale Semiconductor ...
Страница 62: ...Chapter 2 MPC5602P Memory Map MPC5602P Microcontroller Reference Manual Rev 4 62 Freescale Semiconductor ...
Страница 104: ...Chapter 4 Clock Description MPC5602P Microcontroller Reference Manual Rev 4 104 Freescale Semiconductor ...
Страница 128: ...Chapter 6 Power Control Unit MC_PCU MPC5602P Microcontroller Reference Manual Rev 4 128 Freescale Semiconductor ...
Страница 272: ...Chapter 12 e200z0 and e200z0h Core MPC5602P Microcontroller Reference Manual Rev 4 272 Freescale Semiconductor ...
Страница 280: ...Chapter 14 Crossbar Switch XBAR MPC5602P Microcontroller Reference Manual Rev 4 280 Freescale Semiconductor ...
Страница 306: ...Chapter 16 Internal Static RAM SRAM MPC5602P Microcontroller Reference Manual Rev 4 306 Freescale Semiconductor ...
Страница 380: ...Chapter 17 Flash Memory MPC5602P Microcontroller Reference Manual Rev 4 380 Freescale Semiconductor ...
Страница 532: ...Chapter 21 LIN Controller LINFlex MPC5602P Microcontroller Reference Manual Rev 4 532 Freescale Semiconductor ...
Страница 578: ...Chapter 22 FlexCAN MPC5602P Microcontroller Reference Manual Rev 4 578 Freescale Semiconductor ...
Страница 708: ...Chapter 25 FlexPWM MPC5602P Microcontroller Reference Manual Rev 4 708 Freescale Semiconductor ...
Страница 742: ...Chapter 26 eTimer MPC5602P Microcontroller Reference Manual Rev 4 742 Freescale Semiconductor ...
Страница 760: ...Chapter 27 Functional Safety MPC5602P Microcontroller Reference Manual Rev 4 760 Freescale Semiconductor ...
Страница 782: ...Chapter 28 Fault Collection Unit FCU MPC5602P Microcontroller Reference Manual Rev 4 782 Freescale Semiconductor ...
Страница 788: ...Chapter 29 Wakeup Unit WKPU MPC5602P Microcontroller Reference Manual Rev 4 788 Freescale Semiconductor ...
Страница 798: ...Chapter 30 Periodic Interrupt Timer PIT MPC5602P Microcontroller Reference Manual Rev 4 798 Freescale Semiconductor ...
Страница 816: ...Chapter 32 Cyclic Redundancy Check CRC MPC5602P Microcontroller Reference Manual Rev 4 816 Freescale Semiconductor ...
Страница 848: ...Chapter 33 Boot Assist Module BAM MPC5602P Microcontroller Reference Manual Rev 4 848 Freescale Semiconductor ...
Страница 930: ...Chapter 36 Nexus Development Interface NDI MPC5602P Microcontroller Reference Manual Rev 4 930 Freescale Semiconductor ...