NXP Semiconductors RDGD31603PSMKEVM, Руководство пользователя, Страница: 10 / 39

NXP Semiconductors
UM11697
RDGD31603PSMKEVM three-phase inverter kit
Test point name Function
GHW Gate high-side W phase
GLU Gate low-side U phase
GLV Gate low-side V phase
GLW Gate low-side W phase
TSENSELU Temperature sense test point low-side U phase input to TSENSEA
VDCLINKW DC link voltage test point low-side W phase input to AMUXIN
Table 3. Test points
...continued
4.2.4 Indicators
The RDGD31603PSMKEVM evaluation board contains LEDs as visual indicators on the
board.
Figure 4. RDGD31603PSMKEVM indicator locations
Name Description
INTBL LED Indicates that a GD3160 INTB fault interrupt has occurred on the low side devices
INTBH LED Indicates that a GD3160 INTB fault interrupt has occurred on the high side devices
Table 4. RDGD31603PSMKEVM indicator descriptions
UM11697 All information provided in this document is subject to legal disclaimers. © NXP B.V. 2021. All rights reserved.
User manual Rev. 1 — 10 December 2021
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