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UM10503
All information provided in this document is subject to legal disclaimers.
© NXP B.V. 2015. All rights reserved.
User manual
Rev. 2.1 — 10 December 2015
1371 of 1441
51.1 How to read this chapter
The debug functions are identical on all LPC43xx/LPC43Sxx parts. The parallel trace port
is not available on the 100-pin packages.
51.2 Basic configuration
•
Select between Debug modes:
–
When the DBGEN pin is HIGH, the ARM debug mode is entered.
–
When the DBGEN pin is LOW, JTAG BSDL is entered.
•
The core frequency must be 120 MHz or lower to use the SWO function.
•
The ETM trace capture speed is limited by the trace pin properties. The maximum
speed is 120 MHz when the EHS bit is set in the pin configuration register for the
multiplexed trace pins (
•
Enable ETB SRAM in the CREG block (see
•
To disable JTAG, see CRP3 for flash-based parts (see
) or use the CREG5 register (
51.3 Features
•
ARM Cortex-M4:
–
Supports both standard JTAG and ARM Serial Wire Debug modes.
–
Direct debug access to all memories, registers, and peripherals.
–
No target resources are required for the debugging session.
–
Trace port provides CPU instruction trace capability. Output can be via a 4-bit trace
data port, or Serial Wire Viewer.
–
ETM time stamping is not implemented.
–
Six instruction breakpoints that can also be used to remap instruction addresses
for code patches. Two data comparators that can be used to remap addresses for
patches to literal values.
–
Four data Watchpoints that can also be used as trace triggers.
–
Instrumentation Trace Macrocell allows additional software controlled trace.
•
ARM Cortex-M0 (M0SUB and M0APP):
–
JTAG debug mode supported.
–
Two instruction breakpoints.
–
Two data Watchpoints that can also be used as trace triggers.
UM10503
Chapter 51: LPC43xx/LPC43Sxx JTAG, Serial Wire Debug
(SWD), and trace functions
Rev. 2.1 — 10 December 2015
User manual