34.3.1 Core Modules
Table 34-1. JTAG Signal Descriptions
Chip signal name
Module signal
name
Description
I/O
JTAG_TMS
JTAG_TMS/
SWD_DIO
JTAG Test Mode Selection
I/O
JTAG_TCLK
JTAG_TCLK/
SWD_CLK
JTAG Test Clock
I
JTAG_TDI
JTAG_TDI
JTAG Test Data Input
I
JTAG_TDO
JTAG_TDO/
TRACE_SWO
JTAG Test Data Output
O
JTAG_TRST_b
JTAG_TRST_b
JTAG Reset
I
Table 34-2. SWD Signal Descriptions
Chip signal name
Module signal
name
Description
I/O
SWD_CLK
JTAG_TCLK/
SWD_CLK
Serial Wire Clock
I
SWD_DIO
JTAG_TMS/
SWD_DIO
Serial Wire Data
I/O
34.3.2 System Modules
Table 34-3. System Signal Descriptions
Chip signal name
Module signal
name
Description
I/O
NMI_b
—
Non-maskable interrupt NOTE: Driving the NMI signal low forces a
non-maskable interrupt, if the NMI function is selected on the
corresponding pin.
I
RESET_b
—
Reset bidirectional signal
I/O
VDD
—
MCU power
I
VSS
—
MCU ground
I
Table 34-4. EWM Signal Descriptions
Chip signal name
Module signal
name
Description
I/O
EWM_IN
EWM_in
EWM input for safety status of external safety circuits. The polarity
of EWM_IN is programmable using the EWM_CTRL[ASSIN] bit.
The default polarity is active-low.
I
EWM_OUT_b
EWM_out
EWM reset out signal
O
Chapter 34 Signal Multiplexing and Pin Assignment
Kinetis KE1xF Sub-Family Reference Manual, Rev. 4, 06/2019
NXP Semiconductors
773
Содержание KE1xF Series
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