
9.4.1 IR Codes
Table 9-3. JTAG Instructions
Instruction
Code[3:0]
Instruction Summary
IDCODE
0000
Selects device identification register for shift
SAMPLE/PRELOAD
0010
Selects boundary scan register for shifting, sampling, and
preloading without disturbing functional operation
SAMPLE
0011
Selects boundary scan register for shifting and sampling
without disturbing functional operation
EXTEST
0100
Selects boundary scan register while applying preloaded
values to output pins and asserting functional reset
HIGHZ
1001
Selects bypass register while three-stating all output pins and
asserting functional reset
CLAMP
1100
Selects bypass register while applying preloaded values to
output pins and asserting functional reset
EZPORT
1101
Enables the EZPORT function for the SoC and asserts
functional reset.
ARM_IDCODE
1110
ARM JTAG-DP Instruction
BYPASS
1111
Selects bypass register for data operations
Factory debug reserved
0101, 0110, 0111
Intended for factory debug only
ARM JTAG-DP Reserved
1000, 1010, 1011, 1110 These instructions will go the ARM JTAG-DP controller.
Please look at ARM JTAG-DP documentation for more
information on these instructions.
Reserved
All other opcodes
Decoded to select bypass register
3. The manufacturer reserves the right to change the decoding of reserved instruction codes in the future
9.5 JTAG status and control registers
Through the ARM Debug Access Port (DAP), the debugger has access to the status and
control elements, implemented as registers on the DAP bus as shown in the following
figure. These registers provide additional control and status for low power mode recovery
and typical run-control scenarios. The status register bits also provide a means for the
debugger to get updated status of the core without having to initiate a bus transaction
across the crossbar switch, thus remaining less intrusive during a debug session.
It is important to note that these DAP control and status registers are not memory mapped
within the system memory map and are only accessible via the Debug Access Port (DAP)
using JTAG, cJTAG, or SWD. The MDM-AP is accessible as Debug Access Port 1 with
the available registers shown in the table below.
Table 9-4. MDM-AP Register Summary
Address
Register
Description
Table continues on the next page...
JTAG status and control registers
K22F Sub-Family Reference Manual, Rev. 4, 08/2016
204
NXP Semiconductors
Содержание K22F series
Страница 2: ...K22F Sub Family Reference Manual Rev 4 08 2016 2 NXP Semiconductors...
Страница 150: ...Private Peripheral Bus PPB memory map K22F Sub Family Reference Manual Rev 4 08 2016 150 NXP Semiconductors...
Страница 168: ...Module clocks K22F Sub Family Reference Manual Rev 4 08 2016 168 NXP Semiconductors...
Страница 198: ...Security Interactions with other Modules K22F Sub Family Reference Manual Rev 4 08 2016 198 NXP Semiconductors...
Страница 258: ...Functional description K22F Sub Family Reference Manual Rev 4 08 2016 258 NXP Semiconductors...
Страница 292: ...Functional description K22F Sub Family Reference Manual Rev 4 08 2016 292 NXP Semiconductors...
Страница 398: ...Functional description K22F Sub Family Reference Manual Rev 4 08 2016 398 NXP Semiconductors...
Страница 628: ...Initialization and application information K22F Sub Family Reference Manual Rev 4 08 2016 628 NXP Semiconductors...
Страница 740: ...Initialization Application Information K22F Sub Family Reference Manual Rev 4 08 2016 740 NXP Semiconductors...
Страница 750: ...Functional description K22F Sub Family Reference Manual Rev 4 08 2016 750 NXP Semiconductors...
Страница 816: ...Application information K22F Sub Family Reference Manual Rev 4 08 2016 816 NXP Semiconductors...
Страница 866: ...Initialization Application Information K22F Sub Family Reference Manual Rev 4 08 2016 866 NXP Semiconductors...
Страница 890: ...Application information K22F Sub Family Reference Manual Rev 4 08 2016 890 NXP Semiconductors...
Страница 1028: ...Initialization Procedure K22F Sub Family Reference Manual Rev 4 08 2016 1028 NXP Semiconductors...
Страница 1040: ...Example configuration for chained timers K22F Sub Family Reference Manual Rev 4 08 2016 1040 NXP Semiconductors...
Страница 1118: ...Device mode IRC48 operation K22F Sub Family Reference Manual Rev 4 08 2016 1118 NXP Semiconductors...
Страница 1122: ...USB Voltage Regulator Module Signal Descriptions K22F Sub Family Reference Manual Rev 4 08 2016 1122 NXP Semiconductors...
Страница 1180: ...Initialization application information K22F Sub Family Reference Manual Rev 4 08 2016 1180 NXP Semiconductors...
Страница 1302: ...Application information K22F Sub Family Reference Manual Rev 4 08 2016 1302 NXP Semiconductors...
Страница 1374: ...Functional description K22F Sub Family Reference Manual Rev 4 08 2016 1374 NXP Semiconductors...