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National Instruments Corporation
I-1
Index
A
accelerometer
BNC connector assignments (figure), 2-4
current excitation, 2-5
design, 2-1 to 2-2
determining scan rate, 2-5 to 2-6
floating (non-referenced) transducer, 2-5
ground-referenced transducer, 2-5
questions about, B-4
SCXI-1530/1531 signal conditioning,
2-2 to 2-3
signal connections, 2-4 to 2-6
typical current-excited accelerometer
(figure), 2-2
auto-detection of modules, 1-8 to 1-9
B
block diagram of SCXI-1530/1531, 2-3
BNC connector assignments (figure), 2-4
C
calibration, 2-13 to 2-14
internal calibration, 2-13 to 2-14
procedures, 2-13 to 2-14
C-based applications
multiplexed scanning, 2-11
parallel scanning, 2-12 to 2-13
channel scanning. See multiplexed scanning.
common questions, B-1 to B-4
configuration, 1-7 to 1-12
auto-detecting modules, 1-8 to 1-9
common questions, B-2 to B-3
configuration/reconfiguration, 1-10
manually adding modules, 1-9 to 1-10
self-test verification, 1-11
steps for, 1-7 to 1-8
troubleshooting self-test verification,
1-11 to 1-12
connecting SCXI-1530/1531 to DAQ device.
See DAQ device.
connectors
BNC connector assignments (figure), 2-4
rear signal connector (figure), 2-7
conventions used in manual, vi
current excitation, 2-5
D
DAQ device
cabling restrictions with plug-in E series
DAQ devices, B-1
connecting to SCXI-1530/1531 for
multiplexed scanning
in PXI combination chassis, 1-5 to 1-6
in SCXI chassis, 1-4 to 1-5
connecting to SCXI-1530/1531 for parallel
scanning, 1-6 to 1-7
low-level DAQ functions and multiplexed
scanning, 2-11
onboard channels one through seven, B-3
unavailable digital lines, B-3
diagnostic resources, online, C-1
digital signals, unavailable with DAQ device
connected (table), B-3
E
environment specifications, A-3
F
floating (non-referenced) transducer, 2-5