Glossary
©
National Instruments Corporation
G-7
SC-2345/2350 Carrier User Manual
S
s
seconds
scan
one or more analog or digital input samples. Typically, the number of input
samples in a scan is equal to the number of channels in the input group. For
example, one pulse from the scan clock produces one scan which acquires
one new sample from every analog input channel in the group.
SCC
signal conditioning component
SCC-LP
refers to all versions in the LP series
SCC-PWR
refers to an SCC power module
SCC-TC
refers to both the SCC-TC01 and the SCC-TC02
SCSI
small computer system interface
SE
single-ended—a term used to describe an analog input that is measured
with respect to a common ground
sensor
a device that responds to a physical stimulus (heat, light, sound, pressure,
motion, flow, and so on), and produces a corresponding electrical signal
signal conditioning
the manipulation of signals to prepare them for digitizing
smart TEDS sensor
a transducer with a built-in self-identification EEPROM that provides
the TEDS
T
TEDS
Transducer Electronic Data Sheet—self-identification and calibration
information, such as sensor identification information, sensitivity,
calibration parameters, location ID, and custom user data, stored in an
EEPROM embedded in an analog sensor. For information on IEEE P1451.4
TEDS-compatible smart sensors, refer to
ni.com/zone
.