Motorola MOTOTRBO 6300, Руководство по обслуживанию

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Tests and Subtests
Subtests 1 and 7 write and read a zero (0) to each location in
memory. Subtests 2 and 8 are the same as subtests 1 and 7 except
that they write and read a -1 instead of 0. Subtests 3 and 9
write bit patterns of alternating 0's and l's to each address in
memory. Subtests 4 and 10 write the one's complement of subtests
3 and 9. Subtests 5 and 11 write and read the addresses of each
location in memory; subtests 6 and 12 write and read the
complements of addresses to every location in memory.
Errors
Test 0 can return the following errors:
Memory error at Address x: Wrote 0's; Read Back x.
Memory error at Address x: Wrote l's; Read Back x.
Memory error at Address x: Wrote x's; Read Back x.
Memory overlap error: Location and contents read back are x x.
Test Output
Output for a run of the memory test is as follows:
MEMORY SUBTEST 1
MEMORY SUBTEST 2
MEMORY SUBTEST 3
MEMORY SUBTEST 4
MEMORY SUBTEST 5
MEMORY SUBTEST 6
MEMORY SUBTEST 7
MEMORY SUBTEST 8
MEMORY SUBTEST 9
MEMORY SUBTEST 10
MEMORY SUBTEST 11
MEMORY SUBTEST 12
TEST 1: MAP TRANSLATION TEST (p)
The map translation test checks the status bits and page table
entry swapping. The subtests are 1 2
1. Read and write memory test, check access and dirty bits.
2. Map tests (page table entry swapping).
2-3