MI 3295 Step Contact Voltage Measuring System
Technical specifications
47
Test signal frequency ...................................... 55 Hz
Influence of probe resistance:
≤
(10 % of r 10 digits)
(Rc, Rp)
max
= (10
+ 100 R) or 2 k
(whichever is lower)
Automatic test of probe resistance.......... yes
Automatic detection of voltage noise.
Test terminals:
S, ES, C1/H, C2/E
Station
10.4 Specific earth resistance (MI 3295S)
Measuring range
Resolution
Accuracy
0.00
… 9.99 Ωm
0.01
Ωm
Calculated value, consider
accuracy of Resistance to earth
function.
10.0
… 99.9 Ωm
0.1
Ωm
100
… 999 Ωm
1
Ωm
1.00
… 9.99 kΩm
0.01 k
Ωm
10.0
… 99.9 kΩm
0.1 k
Ωm
Measuring range
Resolution
Accuracy
0.00
… 9.99 Ωft
0.01
Ωft
Calculated value, consider
accuracy of Resistance to earth
function.
10.0
… 99.9 Ωft
0.1
Ωft
100
… 999 Ωft
1
Ωft
1.00
… 9.99 kΩft
0.01 k
Ωft
10.0
… 299.9 kΩft
0.1 k
Ωft
Wenner method principle with equal distances between test probes:
= 2·
·distance·R.
10.5 Potential (MI 3295M)
Measuring range U
m
Resolution
Accuracy
0.01
… 19.99 mV
0.01 mV
(2 % of r 2 dig)
20.0
… 199.9 mV
0.1 mV
200
… 1999 mV
1 mV
2.00
… 19.99 V
0.01 V
20.0
… 59.9 V
0.1V
Calculated measuring
range U
Resolution
Accuracy
0.01
… 19.99 mV
0.01 mV
calculated value*
20.0
… 199.9 mV
0.1 mV
200
… 1999 mV
1 mV
2.00
… 19.99 V
0.01 V
20.0
… 199.9 V
0.1 V
200
… 999 V
1 V
1.00
… 9.99 kV
10 V
*Displayed Potential is obtained on base of calculation:
U
S
=U
m ∙
I
fault
/I
gen